Valladolid
Universidad
Nokia Foundation
Espoo, FinlandiaPublications en collaboration avec des chercheurs de Nokia Foundation (20)
2024
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Securecipher: An instantaneous synchronization stream encryption system for insider threat data leakage protection
Expert Systems with Applications, Vol. 254
2022
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Secure File Systems for the Development of a Data Leak Protection (DLP) Tool Against Internal Threats
Iberian Conference on Information Systems and Technologies, CISTI
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Survey of Techniques on Data Leakage Protection and Methods to address the Insider threat
Cluster Computing, Vol. 25, Núm. 6, pp. 4289-4302
2009
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User-centric future internet and telecommunication services
Towards the Future Internet: A European Research Perspective (IOS Press), pp. 217-226
2006
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InP surface properties under ICP plasma etching using mixtures of chlorides and hydrides
Materials Science in Semiconductor Processing, Vol. 9, Núm. 1-3, pp. 225-229
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InP surface properties under ICP plasma etching using mixtures of chlorides and hydrides
Conference Proceedings - International Conference on Indium Phosphide and Related Materials
2004
2003
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Direct evidence for group III atoms migration in aged 980 nm InGaAs/AlGaAs pump lasers
Physica Status Solidi (A) Applied Research
2002
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Design fabrication, and evaluation of an internally cooled silicon carbide mirror
Review of Scientific Instruments
2000
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Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7-x thin films
Journal of Materials Research, Vol. 15, Núm. 5, pp. 1069-1075
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Dominant iron gettering mechanism in p/p+ silicon wafers
Applied Physics Letters, Vol. 77, Núm. 2, pp. 241-243
1999
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Atomistic simulations of ion implantation and diffusion
International Conference on Simulation of Semiconductor Processes and Devices, SISPAD
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Boron pileup and clustering in silicon-on-insulator films
Applied Physics Letters, Vol. 75, Núm. 8, pp. 1083-1085
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Passivation of the Facets of 980 nm GaAs Pump Lasers by a Pulsed UV Laser-Assisted Technique
Journal of Electronic Materials, Vol. 28, Núm. 2, pp. 83-90
1997
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Atomistic model of transient enhanced diffusion and clustering of boron in silicon
Materials Research Society Symposium - Proceedings
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Boron-Enhanced-Diffusion of boron: The limiting factor for ultra-shallow junctions
Technical Digest - International Electron Devices Meeting, IEDM
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Thin film resistors and capacitors for advanced packaging
Proceedings of the International Symposium and Exhibition on Advanced Packaging Materials Processes, Properties and Interfaces, pp. 71-74
1996
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A microraman study of the structural properties of PLD high Tc superconducting thin films
Physica C: Superconductivity and its Applications, Vol. 270, Núm. 1-2, pp. 144-154
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Oxygen content of YBaCuO thin films
Physica C: Superconductivity and its Applications, Vol. 256, Núm. 3-4, pp. 291-297
1995
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Raman microprobe analysis of patterned high Tc superconductor (YBCO) thin films
Materials Research Bulletin, Vol. 30, Núm. 6, pp. 771-778