Experimental verification of direct tunneling assisted electron capture of disordered-induced gap states in metal-insulator-semiconductor structures
- Castán, H.
- Dueñas, S.
- Barbolla, J.
Revista:
Japanese Journal of Applied Physics, Part 2: Letters
ISSN: 0021-4922
Any de publicació: 2002
Volum: 41
Número: 11 A
Tipus: Carta