Experimental verification of direct tunneling assisted electron capture of disordered-induced gap states in metal-insulator-semiconductor structures
- Castán, H.
- Dueñas, S.
- Barbolla, J.
Journal:
Japanese Journal of Applied Physics, Part 2: Letters
ISSN: 0021-4922
Year of publication: 2002
Volume: 41
Issue: 11 A
Type: Letter