Defect signatures in degraded high power laser diodes

  1. Hortelano, V.
  2. Anaya, J.
  3. Souto, J.
  4. Jiménez, J.
  5. Perinet, J.
  6. Laruelle, F.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2013

Volume: 53

Issue: 9-11

Pages: 1501-1505

Type: Conference paper

DOI: 10.1016/J.MICROREL.2013.07.071 GOOGLE SCHOLAR

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