Modeling and experimental characterization of stepped and v-shaped {311} defects in silicon

1. Marqués, L.A.
2. Aboy, M.
3. Dudeck, K.J.
4. Botton, G.A.
5. Knights, A.P.
6. Gwilliam, R.M.

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DOI: 10.1063/1.4871538 GOOGLE SCHOLAR lock_openUVADOC editor