Trapping activity on multicrystalline Si wafers studied by combining fast PL imaging and high resolved electrical techniques

  1. Martinez, O.
  2. Moralejo, B.
  3. Hortelano, V.
  4. Tejero, A.
  5. Gonzalez, M.A.
  6. Jimenez, J.
  7. Mass, J.
  8. Parra, V.
Actas:
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013

ISBN: 9781467346689

Año de publicación: 2013

Páginas: 361-364

Tipo: Aportación congreso

DOI: 10.1109/CDE.2013.6481417 GOOGLE SCHOLAR