Investigation of temperature distribution in power GaAs transistors using spatially resolved photoluminescence mapping compared with full thermal modeling

  1. Landesman, J.P.
  2. Martin, E.
  3. Gautier, T.
  4. Braun, P.
  5. Assouad, Y.
Actes:
Proceedings of the 1998 4th International Workshop on Thermal Investigations of ICs and Microstructures

Any de publicació: 1998

Pàgines: 221-226

Tipus: Aportació congrés

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