Investigation of temperature distribution in power GaAs transistors using spatially resolved photoluminescence mapping compared with full thermal modeling

  1. Landesman, J.P.
  2. Martin, E.
  3. Gautier, T.
  4. Braun, P.
  5. Assouad, Y.
Konferenzberichte:
Proceedings of the 1998 4th International Workshop on Thermal Investigations of ICs and Microstructures

Datum der Publikation: 1998

Seiten: 221-226

Art: Konferenz-Beitrag

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