Investigation of temperature distribution in power GaAs transistors using spatially resolved photoluminescence mapping compared with full thermal modeling
- Landesman, J.P.
- Martin, E.
- Gautier, T.
- Braun, P.
- Assouad, Y.
Actes de conférence:
Proceedings of the 1998 4th International Workshop on Thermal Investigations of ICs and Microstructures
Année de publication: 1998
Pages: 221-226
Type: Communication dans un congrès