Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation

1. Santos, I.
2. Ruiz, M.
3. Aboy, M.
4. Marqués, L.A.
5. López, P.
6. Pelaz, L.

Exporta

Exporta

×

MLA

modern-language-association

APA

apa

Chicago

chicago-fullnote-bibliography

Harvard

harvard-cite-them-right

Vancouver

vancouver-author-date

---

RIS BibTex

Exporta

×

El document no es pot exportar perquè pertany a un altre portal.

Text complet

lock_openUVADOC externo

DOI: 10.1007/S11664-018-6140-X GOOGLE SCHOLAR lock_openUVADOC editor