Empirical Modelling of ReRAM Measured Characteristics Using Charge and Flux

  1. Al Chawa, M.M.
  2. De Benito, C.
  3. Castan, H.
  4. Duenas, S.
  5. Stavrinides, S.G.
  6. Tetzlaff, R.
  7. Picos, R.
Konferenzberichte:
2022 11th International Conference on Modern Circuits and Systems Technologies, MOCAST 2022

ISBN: 9781665467179

Datum der Publikation: 2022

Art: Konferenz-Beitrag

DOI: 10.1109/MOCAST54814.2022.9837658 GOOGLE SCHOLAR