Empirical Modelling of ReRAM Measured Characteristics Using Charge and Flux
- Al Chawa, M.M.
- De Benito, C.
- Castan, H.
- Duenas, S.
- Stavrinides, S.G.
- Tetzlaff, R.
- Picos, R.
Actes de conférence:
2022 11th International Conference on Modern Circuits and Systems Technologies, MOCAST 2022
ISBN: 9781665467179
Année de publication: 2022
Type: Communication dans un congrès