Empirical Modelling of ReRAM Measured Characteristics Using Charge and Flux

  1. Al Chawa, M.M.
  2. De Benito, C.
  3. Castan, H.
  4. Duenas, S.
  5. Stavrinides, S.G.
  6. Tetzlaff, R.
  7. Picos, R.
Actes de conférence:
2022 11th International Conference on Modern Circuits and Systems Technologies, MOCAST 2022

ISBN: 9781665467179

Année de publication: 2022

Type: Communication dans un congrès

DOI: 10.1109/MOCAST54814.2022.9837658 GOOGLE SCHOLAR