Empirical Modelling of ReRAM Measured Characteristics Using Charge and Flux

  1. Al Chawa, M.M.
  2. De Benito, C.
  3. Castan, H.
  4. Duenas, S.
  5. Stavrinides, S.G.
  6. Tetzlaff, R.
  7. Picos, R.
Proceedings:
2022 11th International Conference on Modern Circuits and Systems Technologies, MOCAST 2022

ISBN: 9781665467179

Year of publication: 2022

Type: Conference paper

DOI: 10.1109/MOCAST54814.2022.9837658 GOOGLE SCHOLAR