Micro-Raman spectroscopy of semiconductors: Principles and applications

  1. Jiménez, J.
  2. de Wolf, I.
  3. Landesman, J.P.
Liburua:
Microprobe Characterization of Optoelectronic Materials

ISBN: 9781560329411

Argitalpen urtea: 2024

Orrialdeak: 89-198

Mota: Liburuko kapitulua

DOI: 10.1201/9781003578673-2 GOOGLE SCHOLAR