Noise analysis of 0.1 μm gate MESFETs and HEMTs
- Mateos, J.
- González, T.
- Pardo, D.
- Tadyszak, P.
- Danneville, F.
- Cappy, A.
ISSN: 0038-1101
Année de publication: 1998
Volumen: 42
Número: 1
Pages: 79-85
Type: Article
Revue:
Solid-State Electronics