Atomistic analysis of the ion beam induced defect evolution
- Aboy, M.
- Pelaz, L.
- Marqués, L.A.
- Barbolla, J.
ISSN: 0168-583X
Year of publication: 2004
Volume: 216
Issue: 1-4
Pages: 100-104
Type: Conference paper
ISSN: 0168-583X
Year of publication: 2004
Volume: 216
Issue: 1-4
Pages: 100-104
Type: Conference paper