Damage buildup model with dose rate and temperature dependence
- Hernández-Mangas, J.M.
- Marqués, L.A.
- Bailón, L.
- L. Pelaz
Proceedings:
2005 Spanish Conference on Electron Devices, Proceedings
ISBN: 9780780388109
Year of publication: 2005
Volume: 2005
Pages: 435-437
Type: Conference paper