Damage buildup model with dose rate and temperature dependence

  1. Hernández-Mangas, J.M.
  2. Marqués, L.A.
  3. Bailón, L.
  4. L. Pelaz
Aktak:
2005 Spanish Conference on Electron Devices, Proceedings

ISBN: 9780780388109

Argitalpen urtea: 2005

Alea: 2005

Orrialdeak: 435-437

Mota: Biltzar ekarpena

DOI: 10.1109/SCED.2005.1504474 GOOGLE SCHOLAR