Investigation of temperature distribution in power GaAs transistors using spatially resolved photoluminescence mapping compared with full thermal modeling

  1. Landesman, J.P.
  2. Martin, E.
  3. Gautier, T.
  4. Braun, P.
  5. Assouad, Y.
Actas:
Proceedings of the 1998 4th International Workshop on Thermal Investigations of ICs and Microstructures

Año de publicación: 1998

Páginas: 221-226

Tipo: Aportación congreso

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