Publicaciones en las que colabora con Óscar González Ossorio (25)
2023
-
Effect of Temperature on the Multilevel Properties and Set and Reset Transitions in HfO2-Based Resistive Switching Devices
14th Spanish Conference on Electron Devices, CDE 2023 - Proceedings
-
Praseodymium Content Influence on the Resistive Switching Effect of HfO2-Based RRAM Devices
14th Spanish Conference on Electron Devices, CDE 2023 - Proceedings
2021
-
Analysis of the performance of Nb2O5-doped SiO2-based MIM devices for memory and neural computation applications
Solid-State Electronics, Vol. 186
-
Effective control of filament efficiency by means of spacer HfAlOx layers and growth temperature in HfO2 based ReRAM devices
Solid-State Electronics, Vol. 183
-
Influences of the temperature on the electrical properties of HfO2-based resistive switching devices
Electronics (Switzerland), Vol. 10, Núm. 22
-
Off-chip prefetching based on Hidden Markov Model for non-volatile memory architectures
PLoS ONE, Vol. 16, Núm. 9 September 2021
-
Performance Assessment of Amorphous HfO2-Based RRAM Devices for Neuromorphic Applications
ECS Journal of Solid State Science and Technology, Vol. 10, Núm. 8
-
Performance assessment of amorphous HfO2-based RRAM devices for neuromorphic applications
ECS Transactions
-
Semiempirical Memdiode Model for Resistive Switching Devices in Dynamic Regimes
Proceedings of the 2021 13th Spanish Conference on Electron Devices, CDE 2021
-
Study of the set and reset transitions in HfO2-based ReRAM devices using a capacitor discharge
Solid-State Electronics, Vol. 183
-
Thermoelectrical characterization of piezoelectric diaphragms: Towards a better understanding of ferroelectrics for future memory applications
ECS Transactions
2020
-
Current Pulses to Control the Conductance in RRAM Devices
IEEE Journal of the Electron Devices Society, Vol. 8, pp. 291-296
-
Current and Voltage Control of Intermediate States in Bipolar Rram Devices for Neuristor Applications
ECS Transactions
-
Double Swing Quiescent-Current: An Experimental Detection Method of Ferroelectricity in Very Leaky Dielectric Films
ECS Transactions
-
Programming pulse width assessment for reliable and low-energy endurance performance in al:Hfo2-based rram arrays
Electronics (Switzerland), Vol. 9, Núm. 5
-
Single and complex devices on three topological configurations of HfO2 based RRAM
LAEDC 2020 - Latin American Electron Devices Conference
-
Using current pulses to control the intermediate conductance states in hafnium oxide-based RRAM devices
LAEDC 2020 - Latin American Electron Devices Conference
2019
-
Controlling the intermediate conductance states in RRAM devices for synaptic applications
Microelectronic Engineering, Vol. 215
-
Dynamics of set and reset processes on resistive switching memories
Microelectronic Engineering, Vol. 216
-
Effective Reduction of the Programing Pulse Width in Al: HfO2-based RRAM Arrays
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2019