Magnetoresistance characterization of nanometer Si metal-oxide- semiconductor transistors
- Meziani, Y.M.
- Łusakowski, J.
- Knap, W.
- Dyakonova, N.
- Teppe, F.
- Romanjek, K.
- Ferrier, M.
- Clerc, R.
- Ghibaudo, G.
- Boeuf, F.
- Skotnicki, T.
ISSN: 0021-8979
Year of publication: 2004
Volume: 96
Issue: 10
Pages: 5761-5765
Type: Article