Magnetoresistance characterization of nanometer Si metal-oxide- semiconductor transistors

  1. Meziani, Y.M.
  2. Łusakowski, J.
  3. Knap, W.
  4. Dyakonova, N.
  5. Teppe, F.
  6. Romanjek, K.
  7. Ferrier, M.
  8. Clerc, R.
  9. Ghibaudo, G.
  10. Boeuf, F.
  11. Skotnicki, T.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2004

Volume: 96

Issue: 10

Pages: 5761-5765

Type: Article

DOI: 10.1063/1.1806991 GOOGLE SCHOLAR