Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

  1. Domínguez, J.
  2. Mass, J.
  3. Moralejo, B.
  4. Martínez, O.
  5. Jiménez, J.
  6. Ardila, A.M.
  7. Parra, V.
Revista:
Journal of Materials Science

ISSN: 0022-2461 1573-4803

Any de publicació: 2012

Volum: 47

Número: 14

Pàgines: 5470-5476

Tipus: Article

DOI: 10.1007/S10853-012-6437-8 GOOGLE SCHOLAR