Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

  1. Domínguez, J.
  2. Mass, J.
  3. Moralejo, B.
  4. Martínez, O.
  5. Jiménez, J.
  6. Ardila, A.M.
  7. Parra, V.
Revue:
Journal of Materials Science

ISSN: 0022-2461,  1573-4803

Année de publication: 2012

Volumen: 47

Número: 14

Pages: 5470-5476

Type: Article

DOI: 10.1007/S10853-012-6437-8 GOOGLE SCHOLAR