Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

  1. Domínguez, J.
  2. Mass, J.
  3. Moralejo, B.
  4. Martínez, O.
  5. Jiménez, J.
  6. Ardila, A.M.
  7. Parra, V.
Revista:
Journal of Materials Science

ISSN: 0022-2461,  1573-4803

Ano de publicación: 2012

Volume: 47

Número: 14

Páxinas: 5470-5476

Tipo: Artigo

DOI: 10.1007/S10853-012-6437-8 GOOGLE SCHOLAR