Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

  1. Domínguez, J.
  2. Mass, J.
  3. Moralejo, B.
  4. Martínez, O.
  5. Jiménez, J.
  6. Ardila, A.M.
  7. Parra, V.
Journal:
Journal of Materials Science

ISSN: 0022-2461 1573-4803

Year of publication: 2012

Volume: 47

Issue: 14

Pages: 5470-5476

Type: Article

DOI: 10.1007/S10853-012-6437-8 GOOGLE SCHOLAR