Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC

  1. Domínguez, J.
  2. Mass, J.
  3. Moralejo, B.
  4. Martínez, O.
  5. Jiménez, J.
  6. Ardila, A.M.
  7. Parra, V.
Aldizkaria:
Journal of Materials Science

ISSN: 0022-2461,  1573-4803

Argitalpen urtea: 2012

Alea: 47

Zenbakia: 14

Orrialdeak: 5470-5476

Mota: Artikulua

DOI: 10.1007/S10853-012-6437-8 GOOGLE SCHOLAR