Interface state density measurement in MOS structures by analysis of the thermally stimulated conductance
- de Dios, A.
- Castán, E.
- Bailón, L.
- Barbolla, J.
- Lozano, M.
- Lora-Tamayo, E.
ISSN: 0038-1101
Argitalpen urtea: 1990
Alea: 33
Zenbakia: 8
Orrialdeak: 987-992
Mota: Artikulua