Simulation analysis of boron pocket deactivation in NMOS transistors with SPER junctions

  1. Aboy, M.
  2. Marqués, L.A.
  3. López, P.
  4. Santos, I.
  5. Barbolla, J.
  6. Duffy, R.
  7. L. Pelaz
Aktak:
2005 Spanish Conference on Electron Devices, Proceedings

ISBN: 9780780388109

Argitalpen urtea: 2005

Alea: 2005

Orrialdeak: 451-454

Mota: Biltzar ekarpena

DOI: 10.1109/SCED.2005.1504479 GOOGLE SCHOLAR