Simulation analysis of boron pocket deactivation in NMOS transistors with SPER junctions

  1. Aboy, M.
  2. Marqués, L.A.
  3. López, P.
  4. Santos, I.
  5. Barbolla, J.
  6. Duffy, R.
  7. L. Pelaz
Actes de conférence:
2005 Spanish Conference on Electron Devices, Proceedings

ISBN: 9780780388109

Année de publication: 2005

Volumen: 2005

Pages: 451-454

Type: Communication dans un congrès

DOI: 10.1109/SCED.2005.1504479 GOOGLE SCHOLAR