Simulation analysis of boron pocket deactivation in NMOS transistors with SPER junctions

  1. Aboy, M.
  2. Marqués, L.A.
  3. López, P.
  4. Santos, I.
  5. Barbolla, J.
  6. Duffy, R.
  7. L. Pelaz
Actas:
2005 Spanish Conference on Electron Devices, Proceedings

ISBN: 9780780388109

Ano de publicación: 2005

Volume: 2005

Páxinas: 451-454

Tipo: Achega congreso

DOI: 10.1109/SCED.2005.1504479 GOOGLE SCHOLAR